SE 400adv PVSENTECH SE 400adv PV 椭偏仪SENTECH SE 400adv PV 椭偏仪。SE 400adv PV multi-angle 激光椭偏仪 用于 film 厚度 and 折射率 of anti-reflective single films查看详情
SER 800 PVSENTECH SER 800 PV 椭偏仪SENTECH SER 800 PV 椭偏仪。SER 800 PV 光谱椭偏仪 用于 光伏s 用于 分析 functional layers and antireflective coatings查看详情
SLISENTECH SLI 终点检测系统SENTECH SLI 终点检测系统。SLI laser-based interferometric EPD 用于 工艺监测 and 终点检测s 是 the perfect partner 用于 原位 optical metrology查看详情
SI 500 CSENTECH SI 500 C ICP-RIE 刻蚀系统SENTECH SI 500 C ICP-RIE 刻蚀系统。SENTECH SI 500 C Cryogenic ICP-RIE system represents the leading edge 用于 inductively coupled plasma (ICP) etching查看详情
SI 591 compactSENTECH SI 591 compact RIE 等离子刻蚀系统SENTECH SI 591 compact RIE 等离子刻蚀系统。SENTECH SI 591 compact RIE 等离子刻蚀系统 配备 load lock 是 a small-footprint solution 用于 chlorine and fluorine-based RIE.查看详情
SI 500 CSENTECH SI 500 C RIE 等离子刻蚀系统SENTECH SI 500 C RIE 等离子刻蚀系统。SI 500 CCP RIE System 配备 He back side cooling, conductively coupled processing of substrates in RIE mode.查看详情
SENresearch 4.0SENTECH SENresearch 4.0 椭偏仪SENTECH SENresearch 4.0 椭偏仪。The SENresearch 4.0 光谱椭偏仪 配备 the widest spectral range. High spectral resolution 是 offered to analyse even thick films查看详情
SENproSENTECH SENpro 椭偏仪SENTECH SENpro 椭偏仪。The SENpro 是 a cost-effective 光谱椭偏仪 without compromising advanced measurement performance.查看详情
SENDIRASENTECH SENDIRA 椭偏仪SENTECH SENDIRA 椭偏仪。The SENDIRA infrared 光谱椭偏仪 测量 thin film 厚度, 折射率, 消光系数查看详情
SE 400advSENTECH SE 400adv 椭偏仪SENTECH SE 400adv 椭偏仪。SE 400adv multiple-angle 激光椭偏仪 用于 厚度 and 折射率 测量 透明薄膜查看详情
SE 500advSENTECH SE 500adv 反射膜厚测量系统SENTECH SE 500adv 反射膜厚测量系统。The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer 厚度 of transparent films.查看详情
