产品信息

SENTECH SE 500adv 反射膜厚测量系统。The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer 厚度 of transparent films.

主要特征

• Unambiguous thickness determination
• Largest measurement range
• Push the limits of laser ellipsometry
• The options of the SE 500adv support applications in many industries:
• 灵活性和模块化
• Customise your tool
• 选件