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SENTECH RM 1000 and RM 2000 反射膜厚测量系统。RM 1000 and 2000 spectroscopic reflectometry tools feature a UV to NIR spectral range from 200 nm to 1000 nm 用于 reliable measurement
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SENTECH RM 1000 and RM 2000 反射膜厚测量系统。RM 1000 and 2000 spectroscopic reflectometry tools feature a UV to NIR spectral range from 200 nm to 1000 nm 用于 reliable measurement
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