产品信息

PHI Genesis 是全自动多技术扫描 XPS/HAXPES 微探针。

主要能力

• 直观样品导航与可靠分析区域识别
• The Only Fully Automated High-Throughput Lab-Based Multitechnique XPS/HAXPES Instrument on the Market Commercially Available
• 优化深度剖析
• 优异的微区分析
• Bring HAXPES synchrotron capabilities into your lab with the PHI Genesis
• Suite Of Specialized Solutions For In Situ Characterization Of Advanced Materials
• PHI Genesis 的能力
• 类似 SEM 的 XPS 微探针